The wavelength of visible light limits optical microscope resolution to 250 nm. Digital Image Correlation (DIC) is a powerful post-processing technique for resolving feature displacements down to 0.1 pixels. Combining DIC and optical microscopes gives 25 nm resolution of the full 2D displacement field. In this way, nano length scale research can be conducted without the need for an AFM or SEM. Moreover, optical microscopy offers the advantage of fast image acquisition.
The primary challenge with in situ materials testing under optical microscopes is out-of-plane specimen deflection. The high magnifications needed to achieve 25 nm displacement field resolution also mean a small depth of field. A few microns out-of-plane motion causes the image to go out of focus. Psylotech’s μTS is specifically designed to keep a sample in- plane during testing. The result is a sophisticated instrument well suited for:
• Continuum Model Validation of finite element analysis through multi-scale testing
• Miniature Sample Testing to facilitate material development where quantities can be low
• Unprecedented Versatility to enable implementation of new experimental techniques